System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Test Fixture (SMD Components)
16034E
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Digital Secondary Systems
Schweitzer Engineering Laboratories, Inc.
SEL digital secondary system solutions (sometimes called digital substation solutions) help protect and control substation primary equipment using digital devices in the secondary system that transmit data via fiber-optic cables. Our flexible, scalable, and economical solutions are built with rugged, field-tested hardware that can withstand harsh environments. Select from two solutions:
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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5G NR Automation Test Tool
IQfact5G
IQfact5G ensures quality device characterization and facilitates easy customization of test flow, thus significantly reducing engineering effort.
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Electrostatic Discharge Test
The electrostatic discharge test is designed to determine the ability of equipment to perform its intended function without permanent degradation of performance as a result of an air discharged electrostatic pulse. Electrostatic discharge is the result of an unbalanced electrical charge. Typically, it is created by insulator surfaces rubbing together or pulling apart. A transfer of electrostatic charge between bodies (materials, components, etc.) at different electrostatic potentials is caused by direct contact.
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Optical Test Optimization Solutions and N1002A for 800G and 1.6T
FlexOTO
Optimize test efficiency and increase DCA-M hardware utilization for high channel count testing in 400G/800G/1.6T and CPO/NPO applications.
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Rugged Convection Cooled System with Intel® Xeon® Processor and MIL-DTL-38999 Connectors
HPERC-KBL-MH
Inside the tiny footprint of ADLINK’s HPERC lives the power of Intel® Xeon® processor and optional GPGPU parallel processing engine based on a NVIDIA Quadro MXM module. Dual removable secure erase RAID-0 SSDs provide 12Gb/s throughput and security for deployment in hostile environments.
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PCI Express 5 Base Specification Receiver Test Automation
N5991PB5A
The N5991PB5A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 5.0 ASICs
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DC Power Systems
Allow efficient distribution of your telecom and data center power utilizing these reliable, scalable and flexible DC power products.
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Semi-automatic Single Phase Close Link kWh Meter Test Bench
SY8120
Hong Kong Songyang Industrial Ltd.
The SY8120 new series semi-automatic single phase energy meter test board, designed according to International Standard, is newly developed ideal measuring equipment for energy meters. The equipment can be operated easily through test board button to preset directly all data of meter under test and test process.
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QE Systems
Abet Technologies offers a range of standard EQE and IQE measurement systems. Model QE-1100 is configured with the most useful components for single junction devices. It has a 350 – 1100 nm range. The QE-1800 is configured with components most useful for components for triple junction cells. Beyond the standard systems offered systems can be custom configured to meet a customer’s metrology needs.
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Environmental Test Probe, PH, Tenma 72-6783 PH Meter
72-6784
The 72-6784 is a typical 0 to 14pH Probe with epoxy body, BNC connector. It is used with pH meter 72-6783 model.
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Accelerated Stress Test Chamber
CSZ's accelerated stress test chambers combine mechanical refrigeration; LN2 cooling and high velocity air flow for fast product temperature change rates. Chambers are typically designed with a change rate up to 30C (54F) per minute based upon the part temperature. Common uses are production stress testing circuit boards, electronic drives, assemblies, etc. Design allows the user to quickly control and change the temperature of the product.
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Hall Effect Measurement System
RH 2010
The RH 2010 Hall Effect Measurement System has been designed for high flexibility and ease of use as a standard system for quick routine control measurements as well as for sophisticated temperature dependent Hall measurements for material research.
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Protocol Test Solutions
Reducing engineering development time, issue resolution cycles, and overall costs; increasing product quality, system reliability, and customer satisfaction.
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Design for Testability (DFT Test)
Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this sta...show more -
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Bluetooth Tests
Devices that are equipped with Bluetooth® technology must, on the one hand, meet the respective country-specific regulatory test requirements, such as B. in accordance with FCC, ISED or CE, as well as test requirements of organizations such as the Bluetooth® SIG or the CTIA have to pass and meet in order to obtain market approval.
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Profile Measurement System
GapGun
The GapGun is a laser gauge, profile measurement system that quickly and accurately quantifies local features such as gap and flush, step, weld and mismatch, radii, scratches, seals, dents, rivets and fasteners. It is a proven technology, used worldwide by most major automotive and aerospace OEMs, with over 1,000 units sold.
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PXIe High Performance System Module: Dual Port (x16), Gen 3
M9023A
The M9023A is a PXIe System Module and is installed in the system slot of a PXIe chassis. When combined with an appropriate host adapter, it will provide a high data BW connection between the host PC and the chassis. The M9023A has a flexible configuration capability. Each card has two Gen 3 x8 PCIe cable links capable of achieving speeds up to 8 GB/s on each port. These two ports can be combined into a single x16 cable link providing a speed of up to 16 GB/s. This means a data-intensive system can be built using high-performance desktop or rack-mounted computers.
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Battery Test
1260
*Basic Battery Load Test*Battery Analysis*Mac*Test*Bad Cell Indicators*Testing the Starter Motor*Low Temperatures Effects
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ICP Microphone System
HT378B02
This model includes a 1/2" microphone cartridge, a mated preamplifier with TEDS, and system calibration. Click the following for individual component information.
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Equipment Front End Module (EFEM) Class 1 Minienvironment System
MiniMax™
Genmark’s MiniMax™ Equipment Front End Module (EFEM) is a class 1 minienvironment system designed to maximize productivity of semiconductor processing equipment tools that require the highest level of automation.The MiniMax™ can be customized to meet the automation requirements of any semiconductor manufacturing tool application and specified with one of the Genmark’s sophisticated and precise wafer and reticle handling robots, including the full line of patented GPR single or dual arm robots, GREX robot series, single and dual wafer aligners, FOUP/FOSB openers, reticle libraries, as well as any other customer specified equipment.
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Data Integration System
Our innovative AI data integration system will automatically do the mappingof your data in an automated way and integrate all types of global data toa harmonized global database so you can keep your existing data outputsand structures.
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Test Probe
MP21
Ideal for hipotting transformers, PCBs and other small assemblies. Four-finger-trigger must extend probe tip before the test can begin. The tester will shut down if the trigger is released
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Diode Driver & Laser System Controllers
The laser controllers provide a simple method of controlling Lumina and other popular laser diode drivers or full laser systems. They include the ability to easily control current levels, pulse modes, and interlock controls as well as monitor voltage and current levels as well as q-switch triggering, external triggering, sync output, and additional I/O signals.
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High Accuracy Dimensional Metrology System
Pinnacle 250
The Pinnacle features a damped granite base and column, with passive vibration isolation. A precision compound X-Y stage with high-speed linear motor drives provides velocity of 400 mm / sec and acceleration of 1000 mm / sec2. This combination of high acceleration and high velocity enables the high throughput required for near-line process monitoring.
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Automated Test Execution Suite
Custom templates provide starting points for different projects including 1-up and Multi-up process models. Several operator interfaces that execute National Instruments TestStand sequences out-of-the box. A collection of reusable templates that make creating and managing your test sequences easier.
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Complete Systems
Universal Testing Device
The universal testing device is intended for a diverse range of measurement and automation tasks in laboratories and in test engineering. Thermocouples, RTDs and other sensors can be directly connected. Electrical AC/DC values can also be acquired with the universal testing device.
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Air Data Adapter Test Panel
TA-241
AZ-241 Adapter Panel is designed to meet manufacturer's requirements. This panel will allow by the book testing of the air data computer when interfaced with the main air data test fixture. The Scott-T transformer is optional or can be customer supplied. Without the Scott-T your API can read the altimeter resolver directly.
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System Design and Prediction Tool
MAPP 3D
MAPP 3D, a free software application for macOS and Windows, is a powerful, multipurpose sound system design tool that delivers precise, high-resolution predictions of sound energy distribution in a three-dimensional sound field. From preproduction to post-show analysis, work faster and smarter with the ability to streamline processes and consolidate designs in one simple, accurate 3D model.